Nanoscale mapping of dielectric properties based on surface adhesion force measurements

doi:10.3762/bjnano.9.84

ISL OpenIR > 青海盐湖研究所知识仓储

	Nanoscale mapping of dielectric properties based on surface adhesion force measurements
	Wang, Ying; Shen, Yue; Wang, Xingya; Shen, Zhiwei; Li, Bin; Hui, Jun; Zhang, Yi
	2018-03-16
发表期刊	BEILSTEIN JOURNAL OF NANOTECHNOLOGY
ISSN	2190-4286
卷号	9 页码:900-906
关键词	Adhesion Atomic Force Microscopy (Afm) Graphene Oxide (Go) Nanoscale Dielectric Properties Reduced Graphene Oxide (Rgo)
摘要	The detection of local dielectric properties is of great importance in a wide variety of scientific studies and applications. Here, we report a novel method for the characterization of local dielectric distributions based on surface adhesion mapping by atomic force microscopy (AFM). The two-dimensional (2D) materials graphene oxide (GO), and partially reduced graphene oxide (RGO), which have similar thicknesses but large differences in their dielectric properties, were studied as model systems. Through direct imaging of the samples with a biased AFM tip in PeakForce Quantitative Nano-Mechanics (PF-QNM) mode, the local dielectric properties of GO and RGO were revealed by mapping their surface adhesion forces. Thus, GO and RGO could be conveniently differentiated. This method provides a simple and general approach for the fast characterization of the local dielectric properties of graphene-based materials and will further facilitate their applications in energy generation and storage devices.
DOI	10.3762/bjnano.9.84
语种	英语
引用统计
文献类型	期刊论文
条目标识符	http://ir.isl.ac.cn/handle/363002/6439
专题	青海盐湖研究所知识仓储
推荐引用方式 GB/T 7714	Wang, Ying,Shen, Yue,Wang, Xingya,et al. Nanoscale mapping of dielectric properties based on surface adhesion force measurements[J]. BEILSTEIN JOURNAL OF NANOTECHNOLOGY,2018,9:900-906.
APA	Wang, Ying.,Shen, Yue.,Wang, Xingya.,Shen, Zhiwei.,Li, Bin.,...&Zhang, Yi.(2018).Nanoscale mapping of dielectric properties based on surface adhesion force measurements.BEILSTEIN JOURNAL OF NANOTECHNOLOGY,9,900-906.
MLA	Wang, Ying,et al."Nanoscale mapping of dielectric properties based on surface adhesion force measurements".BEILSTEIN JOURNAL OF NANOTECHNOLOGY 9(2018):900-906.

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